90
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NanoLab Inc
focused ion beam milling-scanning electron microscopy Focused Ion Beam Milling Scanning Electron Microscopy, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/focused+ion+beam+milling+and+scanning+electron+microscopy+instrument/pmc11848817__ja4c11357_si_001-58-1-20?v=NanoLab+Inc Average 90 stars, based on 1 article reviews
focused ion beam milling-scanning electron microscopy - by Bioz Stars,
2026-08
90/100 stars
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